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SPIE Smart Structures /Non-Destructive Evaluation 2016

SPIE Smart Structures /Non-Destructive Evaluation 2016

Date of beginning

Sunday, 20 March 2016

Duration

5 days

Deadline for abstracts

Tuesday, 08 September 2015

City

Las Vegas

Country

United States

Contact

Customer Service

E-Mail

This email address is being protected from spambots. You need JavaScript enabled to view it.

Expected participants

800

Participants

0

Memo

SPIE Smart Structures/NDE is a leading conference on the applied technologies of advanced materials, smart sensor networks, and non-destructive evaluation tools. This event showcases the unique collaboration between engineers who develop smart materials, and researchers using sensor networks and non-destructive evaluation methods to monitor the health of structural and biological systems.

General Conference Attendance: 800

Conference Topic Areas:

• Bioinspiration, Biomimetics, and Bioreplication

• Electroactive Polymer Actuators and Devices (EAPAD)

• Active and Passive Smart Structures and Integrated Systems

• Behavior and Mechanics of Multifunctional Materials and Composites

• Industrial and Commercial Applications of Smart Structures Technologies

• Nano-, Bio-, Info-Tech Sensors and Systems

• Sensors and Smart Structures Technologies for Civil, Mechanical, and Aerospace Systems

• Smart Sensors Phenomena, Technology, Networks, and Systems Integration

• Structural Health Monitoring & Inspection of Advanced Materials, Aerospace, and Civil Infrastructure

• Health Monitoring of Structural and Biological Systems

• Smart Materials and Nondestructive Evaluation for Energy Systems



Course

Smart Structures/NDE 2016 will offer a half-day technical course on EAPs – Electroactive Polymers. Any additional Course listings will be available November 2015.



There is not an Exhibit at Smart Structures/NDE, but there are multiple Sponsorship opportunities available for this event. Contact SPIE Sales Team Member: Lara Miles Tel: +1 360 685 5537 Email: This email address is being protected from spambots. You need JavaScript enabled to view it.