3rd International conference on Big Data, Machine learning and Applications (BIGML 2022)

Memo

3rd International conference on Big Data, Machine learning and Applications (BIGML 2022) July 30-31, 2022, London, United Kingdom https://ccsit2022.org/bigml/index Scope & Topics 3rd International conference on Big Data, Machine learning and Applications (BIGML 2022) will provide an excellent international forum for sharing knowledge and results in theory, methodology and applications of Big data and Machine Learning. The aim of the conference is to provide a platform to the researchers and practitioners from both academia as well as industry to meet and share cutting-edge development in the field. Topics of interest include, but are not limited to, the following: Big Data Techniques, models and algorithms Big Data Infrastructure and platform Big Data Search and Mining Big Data Security, Privacy and Trust Big Data Applications, Bioinformatics, Multimedia etc Big Data Tools and systems Big Data Mining Big Data Management Cloud and grid computing for Big Data Machine Learning and AI for Big Data Big Data Analytics and Social Media 5G and Networks for Big Data Applications Learning in knowledge-intensive systems Learning Methods and analysis Learning Problems Smart city Fog Computing Cloud Computing IoT Computer Vision Bayesian Network Data Mining PAPER SUBMISSION Authors are invited to submit papers through the conference Submission System by July 16, 2022(Final Call) . Submissions must be original and should not have been published previously or be under consideration for publication while being evaluated for this conference. The proceedings of the conference will be published by Computer Science Conference Proceedings in Computer Science & Information Technology (CS & IT) series (Confirmed) Important Dates Submission Deadline : July 16, 2022(Final Call) Authors Notification : July 26, 2022 Registration & Camera-Ready Paper Due : July 28, 2022 Contact Us Here’s where you can reach us : This email address is being protected from spambots. You need JavaScript enabled to view it.